Abstract
Formation of an interstitial solid solution Hf5Ga xSn3 (x = 0-1) based on the binary compound Hf 5Sn3 (structure type Mn5Si3, Pearson symbol hP16, space group P63/mcm, a = 8.36562(6), c = 5.70775(4) from X-ray powder diffraction) was established at 600 °C. The crystal structure (structure type Hf5CuSn3, ordered derivative of Ti5Ga4, hP18, P63/mcm) was refined on X-ray single-crystal diffraction data for three compositions: Hf5Ga 0.16(3)Sn3 (a = 8.3288(12), c = 5.6988(11) ), Hf 5Ga0.53(2)Sn3 (a = 8.4205(12), c = 5.7655(12) ) and Hf5GaSn3 (a = 8.5564(12), c = 5.7859(12) ). The Ga atoms occupy Wyckoff position 2b at the centres of Hf6 octahedral interstices.
Originalsprache | Englisch |
---|---|
Seiten (von - bis) | 246-251 |
Seitenumfang | 6 |
Fachzeitschrift | Journal of Alloys and Compounds |
Jahrgang | 512 |
Ausgabenummer | 1 |
DOIs | |
Publikationsstatus | Veröffentlicht - 25 Jan. 2012 |