Interstitial solid solution Hf5GaxSn3 (x = 0-1)

I. Voznyak, Ya Tokaychuk, V. Hlukhyy, T. F. Fässler, R. Gladyshevskii

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

4 Zitate (Scopus)

Abstract

Formation of an interstitial solid solution Hf5Ga xSn3 (x = 0-1) based on the binary compound Hf 5Sn3 (structure type Mn5Si3, Pearson symbol hP16, space group P63/mcm, a = 8.36562(6), c = 5.70775(4) from X-ray powder diffraction) was established at 600 °C. The crystal structure (structure type Hf5CuSn3, ordered derivative of Ti5Ga4, hP18, P63/mcm) was refined on X-ray single-crystal diffraction data for three compositions: Hf5Ga 0.16(3)Sn3 (a = 8.3288(12), c = 5.6988(11) ), Hf 5Ga0.53(2)Sn3 (a = 8.4205(12), c = 5.7655(12) ) and Hf5GaSn3 (a = 8.5564(12), c = 5.7859(12) ). The Ga atoms occupy Wyckoff position 2b at the centres of Hf6 octahedral interstices.

OriginalspracheEnglisch
Seiten (von - bis)246-251
Seitenumfang6
FachzeitschriftJournal of Alloys and Compounds
Jahrgang512
Ausgabenummer1
DOIs
PublikationsstatusVeröffentlicht - 25 Jan. 2012

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