TY - GEN
T1 - Influence of temperature effects on sensitivity of surface plasmon resonance sensors
AU - Moreiral, C. S.
AU - Lima, A. M.N.
AU - Neff, H.
PY - 2008
Y1 - 2008
N2 - The variation of instrumental sensitivity as function of environmental temperature of a Surface Plasmon Resonance (SPR) sensor has been exploited here experimentally and theoretically for both, angular and wavelength interrogation modes (AIM, WIM). A compact, robust commercial SPR device has been used, operating in the AIM at the range 275K < T < 320K. At temperature < 300K, S steadily deteriorates from 120 to 30 deg/RIU (refractive index unit). A singularity has been identified in the simulations, based on analytical and numerical approaches, near the freezing point of water while a soft transition appears in the experiment. Towards higher device temperatures at 300K < T < 370K, instrumental sensitivities for both AIM and WIM decreases weakly. The effect is more pronounced at shorter wavelength ≤ 550nm, and in the WIM. A steady increase towards higher T was observed for the SPR-line broadening parameter in the AIM, but a distinct maximum resolved at 305K for wavelength interrogation.
AB - The variation of instrumental sensitivity as function of environmental temperature of a Surface Plasmon Resonance (SPR) sensor has been exploited here experimentally and theoretically for both, angular and wavelength interrogation modes (AIM, WIM). A compact, robust commercial SPR device has been used, operating in the AIM at the range 275K < T < 320K. At temperature < 300K, S steadily deteriorates from 120 to 30 deg/RIU (refractive index unit). A singularity has been identified in the simulations, based on analytical and numerical approaches, near the freezing point of water while a soft transition appears in the experiment. Towards higher device temperatures at 300K < T < 370K, instrumental sensitivities for both AIM and WIM decreases weakly. The effect is more pronounced at shorter wavelength ≤ 550nm, and in the WIM. A steady increase towards higher T was observed for the SPR-line broadening parameter in the AIM, but a distinct maximum resolved at 305K for wavelength interrogation.
KW - Drude model
KW - Line broadening
KW - Surface plasmon resonance
KW - Temperature dependence
UR - https://www.scopus.com/pages/publications/51349161230
U2 - 10.1109/IMTC.2008.4547025
DO - 10.1109/IMTC.2008.4547025
M3 - Conference contribution
AN - SCOPUS:51349161230
SN - 1424415411
SN - 9781424415410
T3 - Conference Record - IEEE Instrumentation and Measurement Technology Conference
SP - 170
EP - 175
BT - 2008 IEEE International Instrumentation and Measurement Technology Conference Proceedings, I2MTC
T2 - 2008 IEEE International Instrumentation and Measurement Technology Conference, I2MTC
Y2 - 12 May 2008 through 15 May 2008
ER -