Impact of gate leakage on efficiency of circuit block switch-off schemes

Stephan Henzler; Philip Teichmann; Markus Koban; Jörg Berthold; Georg Georgakos; Doris Schmitt-Landsiedel

doi:10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes

Stephan Henzler, Philip Teichmann, Markus Koban, Jörg Berthold, Georg Georgakos, Doris Schmitt-Landsiedel

Medicine and Health

Publikation: Beitrag in Buch/Bericht/Konferenzband › Kapitel › Begutachtung

1 Zitat (Scopus)

Abstract

Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.

Originalsprache	Englisch
Titel	VLSI-SOC
Untertitel	From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003)
Redakteure/-innen	Manfred Glesner Leandro, Indrusiak, Hans Eveking, Ricardo Reis, Vincent Mooney
Seiten	229-245
Seitenumfang	17
DOIs	https://doi.org/10.1007/0-387-33403-3_15
Publikationsstatus	Veröffentlicht - 2006

Publikationsreihe

Name	IFIP International Federation for Information Processing
Band	200
ISSN (Print)	1571-5736

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10.1007/0-387-33403-3_15

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Henzler, S., Teichmann, P., Koban, M., Berthold, J., Georgakos, G., & Schmitt-Landsiedel, D. (2006). Impact of gate leakage on efficiency of circuit block switch-off schemes. in M. G. Leandro, Indrusiak, H. Eveking, R. Reis, & V. Mooney (Hrsg.), VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003) (S. 229-245). (IFIP International Federation for Information Processing; Band 200). https://doi.org/10.1007/0-387-33403-3_15

Henzler, Stephan ; Teichmann, Philip ; Koban, Markus et al. / Impact of gate leakage on efficiency of circuit block switch-off schemes. VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). Hrsg. / Manfred Glesner Leandro ; Indrusiak ; Hans Eveking ; Ricardo Reis ; Vincent Mooney. 2006. S. 229-245 (IFIP International Federation for Information Processing).

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title = "Impact of gate leakage on efficiency of circuit block switch-off schemes",

abstract = "Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.",

keywords = "Circuit Block Switch-Off, GSCMOS, Gate-Tunneling, MTCMOS, Sleep-Transistor Scheme, ZZSCCMOS, ZigZag",

author = "Stephan Henzler and Philip Teichmann and Markus Koban and J{\"o}rg Berthold and Georg Georgakos and Doris Schmitt-Landsiedel",

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Henzler, S, Teichmann, P, Koban, M, Berthold, J, Georgakos, G & Schmitt-Landsiedel, D 2006, Impact of gate leakage on efficiency of circuit block switch-off schemes. in MG Leandro, Indrusiak, H Eveking, R Reis & V Mooney (Hrsg.), VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). IFIP International Federation for Information Processing, Bd. 200, S. 229-245. https://doi.org/10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes. / Henzler, Stephan; Teichmann, Philip; Koban, Markus et al.
VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). Hrsg. / Manfred Glesner Leandro; Indrusiak; Hans Eveking; Ricardo Reis; Vincent Mooney. 2006. S. 229-245 (IFIP International Federation for Information Processing; Band 200).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Kapitel › Begutachtung

TY - CHAP

T1 - Impact of gate leakage on efficiency of circuit block switch-off schemes

AU - Henzler, Stephan

AU - Teichmann, Philip

AU - Koban, Markus

AU - Berthold, Jörg

AU - Georgakos, Georg

AU - Schmitt-Landsiedel, Doris

PY - 2006

Y1 - 2006

N2 - Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.

AB - Two different schemes to switch-off unused circuit blocks (ZigZag-cut-off scheme and n-/p-block MTCMOS cut-off schemeare examined in deep-submicron technologies by analytical investigation and simulation. The theoretical basis of the ZigZag-scheme is given and particular design constraints are discussed. It is shown that the power-saving benefits of the ZigZag-scheme are critically dependent on the gate-leakage, whereas n- or p-block switching keep their effectiveness. Finally it is derived that n-block switching tends to cause severe glitch activity during power-up process degrading both power-up-time and energy loss. The ZigZag-scheme however does not suffer from this effect. The advantages and drawbacks of the two schemes are compared depending on the available technology generation. Finally recent extensions to ZigZag are discussed.

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Henzler S, Teichmann P, Koban M, Berthold J, Georgakos G, Schmitt-Landsiedel D. Impact of gate leakage on efficiency of circuit block switch-off schemes. in Leandro MG, Indrusiak, Eveking H, Reis R, Mooney V, Hrsg., VLSI-SOC: From Systems to Chips: IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003). 2006. S. 229-245. (IFIP International Federation for Information Processing). doi: 10.1007/0-387-33403-3_15

Impact of gate leakage on efficiency of circuit block switch-off schemes

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