Abstract
Morphometric investigations on sections for light and electron microscopy help to substantiate morphological results statistically. Technically, the simplest morphometric method utilizing lines- and square lattices has proven both tiresome and time consuming. In continuation of our earlier work, we have developed an intelligent morphometer by the inclusion of a microcalculator whose manipulation through the dialogue contact with the operator is very simple. This speeds up the morphometric investigations with the lattice. The system can be expanded and connected to any type of computer. The basic model already carries out morphometric calculations with automatic documentation. By a simple change of programme the apparatus can be adapted to any particular problem. With the necessary adaptations the morphometric analyses can be carried out directly with the electron microscope.
Titel in Übersetzung | Semiautomatic intelligent morphometer for electron micrographs and 'on-line' morphometric investigations on the electron microscope |
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Originalsprache | Deutsch |
Seiten (von - bis) | 193-202 |
Seitenumfang | 10 |
Fachzeitschrift | Mikroskopie |
Jahrgang | 40 |
Ausgabenummer | 7-8 |
Publikationsstatus | Veröffentlicht - 1983 |
Extern publiziert | Ja |