Zur Hauptnavigation wechseln Zur Suche wechseln Zum Hauptinhalt wechseln

Formation of graphene atop a Si adlayer on the C-face of SiC

  • Jun Li
  • , Qingxiao Wang
  • , Guowei He
  • , Michael Widom
  • , Lydia Nemec
  • , Volker Blum
  • , Moon Kim
  • , Patrick Rinke
  • , Randall M. Feenstra

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

2 Zitate (Scopus)

Abstract

The structure of the SiC(0001) surface, the C-face of the {0001} SiC surfaces, is studied as a function of temperature and of pressure in a gaseous environment of disilane (Si2H6). Various surface reconstructions are observed, both with and without the presence of an overlying graphene layer (which spontaneously forms at sufficiently high temperatures). Based on cross-sectional scanning transmission electron microscopy measurements, the interface structure that forms in the presence of the graphene is found to contain 1.4-1.7 monolayers (ML) of Si, a somewhat counter-intuitive result since, when the graphene forms, the system is actually under C-rich conditions. Using ab initio thermodynamics, it is demonstrated that there exists a class of Si-rich surfaces containing about 1.3 ML of Si that are stable on the surface (even under C-rich conditions) at temperatures above ∼400 K. The structures that thus form consist of Si adatoms atop a Si adlayer on the C-face of SiC, with or without the presence of overlying graphene.

OriginalspracheEnglisch
Aufsatznummer084006
FachzeitschriftPhysical Review Materials
Jahrgang3
Ausgabenummer8
DOIs
PublikationsstatusVeröffentlicht - 19 Aug. 2019
Extern publiziertJa

Fingerprint

Untersuchen Sie die Forschungsthemen von „Formation of graphene atop a Si adlayer on the C-face of SiC“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren