@inproceedings{f08e209385964e02bc6094bac1c80a97,
title = "Fault-Simulation-Based Flip-Flop Classification for Reverse Engineering",
abstract = "This work outlines a crucial step in gate-level netlist reverse engineering: classifying control and data flip-flops (FFs) to discern control logic and data paths. Existing methods rely mainly on structural characteristics, which can have disavantages. Our work introduces a novel approach that classifies FFs based on observed characteristics after fault insertion and propagation. We develop three new classification methods for block cipher implementations, emphasizing their significance in system security. However, we also explore the approach's applicability to other design types. We apply the approach on AES implementations using an automatic fault simulation framework, which shows perfect results for most classifications.",
keywords = "Block Cipher, Fault Simulation, Flip-Flop Classification, Hardware Reverse Engineering",
author = "Michael Mildner and Michaela Brunner and Michael Gruber and Johanna Baehr and Georg Sigl",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 27th International Symposium on Design and Diagnostics of Electronic Circuits and Sytems, DDECS 2024 ; Conference date: 03-04-2024 Through 05-04-2024",
year = "2024",
doi = "10.1109/DDECS60919.2024.10508905",
language = "English",
series = "Proceedings - 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2024",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "53--56",
editor = "Stanislaw Deniziak and Pawel Sitek and Maksim Jenihhin and Andreas Steininger and Mario Scholzel and Vojtech Mrazek",
booktitle = "Proceedings - 2024 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2024",
}