Error-resistant single-qubit gates with trapped ions

N. Timoney; V. Elman; S. Glaser; C. Weiss; M. Johanning; W. Neuhauser; Chr Wunderlich

doi:10.1103/PhysRevA.77.052334

Error-resistant single-qubit gates with trapped ions

N. Timoney, V. Elman, S. Glaser, C. Weiss, M. Johanning, W. Neuhauser, Chr Wunderlich

Professur für Organische Chemie

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

107 Zitate (Scopus)

Abstract

Coherent operations with individual trapped Yb+ ions are demonstrated that are robust against variations in experimental parameters and intrinsically indeterministic system parameters. In particular, pulses developed using optimal control theory are demonstrated with trapped ions. Their performance as a function of error parameters is systematically investigated and compared to composite pulses. Such pulses are basic building blocks for single and multiqubit quantum gates.

Originalsprache	Englisch
Aufsatznummer	052334
Fachzeitschrift	Physical Review A
Jahrgang	77
Ausgabenummer	5
DOIs	https://doi.org/10.1103/PhysRevA.77.052334
Publikationsstatus	Veröffentlicht - 30 Mai 2008

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10.1103/PhysRevA.77.052334

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AU - Wunderlich, Chr

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AB - Coherent operations with individual trapped Yb+ ions are demonstrated that are robust against variations in experimental parameters and intrinsically indeterministic system parameters. In particular, pulses developed using optimal control theory are demonstrated with trapped ions. Their performance as a function of error parameters is systematically investigated and compared to composite pulses. Such pulses are basic building blocks for single and multiqubit quantum gates.

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Error-resistant single-qubit gates with trapped ions

Abstract

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