Abstract
Recent measurements of the mean free path for inelastic scattering of low energy electrons in solids have indicated the surface sensitivity of photoelectron spectroscopy. The present paper describes an ultra-high vacuum system which makes possible XPS, UPS, LEED and other surface measurements in one system. Examples of its application are given from the chemisorption system tungsten (110)/oxygen.
| Originalsprache | Englisch |
|---|---|
| Seiten (von - bis) | 15-20 |
| Seitenumfang | 6 |
| Fachzeitschrift | Vak Tech |
| Jahrgang | 24 |
| Ausgabenummer | 1 |
| Publikationsstatus | Veröffentlicht - 1975 |