Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp; Patrick Reinhard; Daniele Pergolesi; Thomas Ryll; Rene Tölke; Enrico Traversa

doi:10.1063/1.3663529

Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Jennifer L.M. Rupp, Patrick Reinhard, Daniele Pergolesi, Thomas Ryll, Rene Tölke, Enrico Traversa

Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung

6 Zitate (Scopus)

Abstract

Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O _3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

Originalsprache	Englisch
Aufsatznummer	012101
Fachzeitschrift	Applied Physics Letters
Jahrgang	100
Ausgabenummer	1
DOIs	https://doi.org/10.1063/1.3663529
Publikationsstatus	Veröffentlicht - 2 Jan. 2012
Extern publiziert	Ja

Zugriff auf Dokument

10.1063/1.3663529

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Dieses zitieren

@article{b412f7d69596468ca7ec9d9be16a568e,

title = "Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films",

abstract = "Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.",

author = "Rupp, {Jennifer L.M.} and Patrick Reinhard and Daniele Pergolesi and Thomas Ryll and Rene T{\"o}lke and Enrico Traversa",

note = "Funding Information: Professor H. Tuller form Massachusetts Institute of Technology (MIT) is thanked for stimulating discussion. The Swiss National Research Foundation (SNF) is acknowledged for the fellowship PA00P2-134153.",

year = "2012",

month = jan,

day = "2",

doi = "10.1063/1.3663529",

language = "English",

volume = "100",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

AU - Rupp, Jennifer L.M.

AU - Reinhard, Patrick

AU - Pergolesi, Daniele

AU - Ryll, Thomas

AU - Tölke, Rene

AU - Traversa, Enrico

N1 - Funding Information: Professor H. Tuller form Massachusetts Institute of Technology (MIT) is thanked for stimulating discussion. The Swiss National Research Foundation (SNF) is acknowledged for the fellowship PA00P2-134153.

PY - 2012/1/2

Y1 - 2012/1/2

N2 - Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

AB - Mixed ionic-electronic conductors (MIECs) such as the (La,Sr)(Co,Fe)O 3-d perovskite family are well described in their charge transport through their high temperature applications, i.e., as solid-oxide fuel cell electrodes (600-1000 °C). In this study, the current-voltage (I-V) profiles of these well-known MIEC perovskites are studied between room temperature and 150 °C under bias of ±15 V for potential applications in resistance random access memories. The impact of the metal-oxide interface on the I-V characteristics ranging from ohmic to non-linear hysteretic is discussed for metals of varying work functions and redox potentials, as well as changes in metal electrode distances and areas.

UR - http://www.scopus.com/inward/record.url?scp=84855544029&partnerID=8YFLogxK

U2 - 10.1063/1.3663529

DO - 10.1063/1.3663529

M3 - Article

AN - SCOPUS:84855544029

SN - 0003-6951

VL - 100

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

M1 - 012101

ER -

Electric-field-induced current-voltage characteristics in electronic conducting perovskite thin films

Abstract

Zugriff auf Dokument

Andere Dateien und Links

Fingerprint

Dieses zitieren