Did we test enough? Functional coverage for post-silicon validation

Sebastian Pointner, Robert Wille

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

2 Zitate (Scopus)

Abstract

The ever increasing complexity of modern systems remains a challenge for semiconductor companies. Once a new chip has been produced, it has to be ensured that it works properly. To this end, sophisticated test environments and test programs are applied. However, to ensure that the applied test program indeed fully covers all important details of the produced chip remains a big challenge. In this work, we propose a methodology which supports the designer by analyzing the coverage of a given test program. To this end, we utilize accomplishments from coverage analysis for functional verification at other abstraction levels. A discussion of the resulting application scenario eventually shows that this allows for an efficient coverage analysis for test programs with basically no changes in the work-flows of test program developers.

OriginalspracheEnglisch
TitelProceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
Seiten31-36
Seitenumfang6
ISBN (elektronisch)9781728147185
DOIs
PublikationsstatusVeröffentlicht - Sept. 2019
Extern publiziertJa
Veranstaltung3rd IEEE International Test Conference in Asia, ITC-Asia 2019 - Tokyo, Japan
Dauer: 3 Sept. 20195 Sept. 2019

Publikationsreihe

NameProceedings - 2019 IEEE International Test Conference in Asia, ITC-Asia 2019

Konferenz

Konferenz3rd IEEE International Test Conference in Asia, ITC-Asia 2019
Land/GebietJapan
OrtTokyo
Zeitraum3/09/195/09/19

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