Device to Circuit Framework for Activity-Dependent NBTI Aging in Digital Circuits

Keyphrases

• Activity-dependent 100%
• Aging 100%
• Digital Circuits 100%
• Negative Bias Temperature Instability 100%
• Arbitrary Inputs 50%
• Timing Degradation 50%
• Compact Model 25%
• Physical Model 25%
• Input Signals 25%
• Model Prediction 25%
• Microprocessor 25%
• Loading Conditions 25%
• S-lay 25%
• Degradation Level 25%
• Fan-out 25%
• Arithmetic Circuits 25%

Engineering

• Digital Circuits 100%
• Negative-Bias Temperature Instability 100%
• Field Effect Transistor 50%
• Model Prediction 25%
• Input Signal 25%
• Load Condition 25%
• Microprocessor Chips 25%
• Physical Model 25%
• Arithmetic Circuit 25%