TY - GEN
T1 - Design of a Tightly-Coupled RISC-V Physical Memory Protection Unit for Online Error Detection
AU - Gerlin, Nicolas
AU - Kaja, Endri
AU - Bora, Monideep
AU - Devarajegowda, Keerthikumara
AU - Stoffel, Dominik
AU - Kunz, Wolfgang
AU - Ecker, Wolfgang
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - While semiconductors are becoming more efficient generation after generation, the continuous technology scaling leads to numerous reliability issues due, amongst others, to variations in transistors characteristics, manufacturing defects, component wear-out, or interference from external and internal sources. Induced bit flips and stuck-at-faults can lead to a system failure. Security-critical systems often use Physical Memory Protection (PMP) modules to enforce memory isolation. The standard loosely-coupled approach eases the implementation but creates overhead in area and performance, limiting the number of protected areas and their size. While delivering great support against malicious software and induced faults, better performance would benefit safety tasks by preventing the program from jumping into an undesired region and giving wrong outputs.We propose a novel model-driven approach to resolve these limitations by generating a tightly-coupled RISC-V PMP, which reduces the impact of run-time reconfiguration. We also discuss guidelines on configuring a PMP to minimize the overhead on performance and memory, and provide an area estimation for each possible PMP design instance. We formally verified a RISC-V Core with a PMP and evaluated its performance with the Dhrystone Benchmark. The presented architecture shows a performance gain of about 3 times against the standard implementation. Furthermore, we observed that adding the PMP feature to a RISC-V SoC led to a negligible performance loss of less than 0.1% per thousand PMP reconfigurations.
AB - While semiconductors are becoming more efficient generation after generation, the continuous technology scaling leads to numerous reliability issues due, amongst others, to variations in transistors characteristics, manufacturing defects, component wear-out, or interference from external and internal sources. Induced bit flips and stuck-at-faults can lead to a system failure. Security-critical systems often use Physical Memory Protection (PMP) modules to enforce memory isolation. The standard loosely-coupled approach eases the implementation but creates overhead in area and performance, limiting the number of protected areas and their size. While delivering great support against malicious software and induced faults, better performance would benefit safety tasks by preventing the program from jumping into an undesired region and giving wrong outputs.We propose a novel model-driven approach to resolve these limitations by generating a tightly-coupled RISC-V PMP, which reduces the impact of run-time reconfiguration. We also discuss guidelines on configuring a PMP to minimize the overhead on performance and memory, and provide an area estimation for each possible PMP design instance. We formally verified a RISC-V Core with a PMP and evaluated its performance with the Dhrystone Benchmark. The presented architecture shows a performance gain of about 3 times against the standard implementation. Furthermore, we observed that adding the PMP feature to a RISC-V SoC led to a negligible performance loss of less than 0.1% per thousand PMP reconfigurations.
KW - Memory protection
KW - Model-based generation
KW - Online error detection
KW - RISC-V
KW - Safety
UR - http://www.scopus.com/inward/record.url?scp=85142419264&partnerID=8YFLogxK
U2 - 10.1109/VLSI-SoC54400.2022.9939622
DO - 10.1109/VLSI-SoC54400.2022.9939622
M3 - Conference contribution
AN - SCOPUS:85142419264
T3 - IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
BT - Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration, VLSI-SoC 2022
PB - IEEE Computer Society
T2 - 30th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2022
Y2 - 3 October 2022 through 5 October 2022
ER -