Design of a Low Noise and Low Background Charge Sensitive Amplifier for the Readout of Germanium Detectors

D. Butta, G. Meli, M. Carminati, F. Henkes, M. Willers, S. Mertens, S. Riboldi, G. Ferrari, M. Castriotta, C. Fiorini

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

Abstract

The observation of neutrinoless double beta decay would have major implications in the understanding of the origin of the matter in the universe. Given zero electric charge and no colour, they may be Majorana particles, i.e. their own antiparticles. The Large Enriched Germanium Experiment for Neutrinoless double beta Decay (LEGEND) is a ton-scale experimental program to search for the neutrinoless decay in the isotope76Ge. In this framework, we have designed a new ASIC in the 0.35 µm CMOS technology, which will fulfill Ge-detector requirements. The ASIC has a key role in order to obtain a good energy resolution and a high radiopurity environment that are crucial conditions in neutrinoless double beta decay experiments. The ASIC has been designed featuring a low noise Charge Sensitive Amplifier (CSA) and an on-chip Low-DropOut regulator (LDO). The LDO allows the chip to be powered without bypass capacitors which are not compliant with the radiopurity requirement. With a 50 pA leakage current and a detector capacitance of 4 pF, the ASIC shows a noise performance of 50 erms -. In this work, we also present the simulated transient response of the CSA. In the end a dedicated Line Driver circuit drives the signal in a differential way over a distance of about 10 m.

OriginalspracheEnglisch
Titel2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers Inc.
ISBN (elektronisch)9781665488723
DOIs
PublikationsstatusVeröffentlicht - 2022
Veranstaltung2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022 - Milano, Italien
Dauer: 5 Nov. 202212 Nov. 2022

Publikationsreihe

Name2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference

Konferenz

Konferenz2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022
Land/GebietItalien
OrtMilano
Zeitraum5/11/2212/11/22

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