Defect-induced electrostatic charging of nitrogen films

Electrostatic charging of nanostructured N₂ films was studied employing optical and a current set of emission spectroscopy methods: cathodoluminescence CL, thermally and photon-stimulated exoelectron emission TSEE, PSEE as well as thermally and photon-stimulated luminescence TSL, PSL. Concurrently with thermally stimulated yield of electrons the yield of nitrogen particles was detected, so-called “postdesorption.” An enhancement of the optical emission stemmed from the neutralization reaction N₄ ⁺ + e → N₂* + N₂* → N₂ + N₂ + hν was observed with an exposure to an electron beam. The experiments performed with a variable voltage applied to an electrode for current detection demonstrated significant accumulation of negative charge. The TSEE current in the low-temperature range was detected at negative voltages up to −30 V. An accumulation of trapped electrons (up to 10¹⁶ cm⁻³) was detected. A possible contribution of N₃ ⁻ in electrostatic charging was assumed. Thermally stimulated yield of negatively charged particles from a N₂ film subjected to an electron beam.