Comparison of josephson vortex flow transistors with different gate line configurations

J. Schuler, S. Weiss, T. Bauch, A. Marx, D. Koelle, R. Gross

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

4 Zitate (Scopus)

Abstract

We performed numerical simulations and experiments on Josephson vortex flow transistors based on parallel arrays of YBa2Cu3O7-δ grain boundary junctions with a cross gate line allowing us to operate the same devices in two different modes named the Josephson fluxon transistor (JFT) and Josephson fluxon-antifluxon transistor (JFAT). The simulations yield a general expression for the current gain versus number of junctions and normalized loop inductance and predict higher current gain for the JFAT. The experiments are in good agreement with simulations and show improved coupling between gate line and junctions for the JFAT.

OriginalspracheEnglisch
Seiten (von - bis)1095-1097
Seitenumfang3
FachzeitschriftApplied Physics Letters
Jahrgang78
Ausgabenummer8
DOIs
PublikationsstatusVeröffentlicht - 19 Feb. 2001
Extern publiziertJa

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