Comparative analysis of nanostructured diblock copolymer films

P. Müller-Buschbaum, N. Hermsdorf, S. V. Roth, J. Wiedersich, S. Cunis, R. Gehrke

Publikation: Beitrag in FachzeitschriftKonferenzartikelBegutachtung

55 Zitate (Scopus)

Abstract

Nanostructured polymer films of poly(styrene-block-paramethylstyrene) diblock copolymers P(Sd-b-pMS) on silicon substrates with a native oxide layer are investigated. Resulting from a storage under-toluene vapor, a surface structure is installed. The early stages, characterized by the creation of a host structure out of an initially continuous film, are addressed. Grazing incidence small-angle X-ray scattering (GISAXS) experiments were performed as a function of exposure time. Results are compared to modelling of the scattering pattern and other experimental techniques, such as grazing incidence small-angle neutron scattering (GISANS) and atomic force microscopy (AFM) data Possibilities and limits of the techniques are discussed.

OriginalspracheEnglisch
Seiten (von - bis)1789-1797
Seitenumfang9
FachzeitschriftSpectrochimica Acta - Part B Atomic Spectroscopy
Jahrgang59
Ausgabenummer10-11
DOIs
PublikationsstatusVeröffentlicht - 8 Okt. 2004
Veranstaltung17th International Congress on X-Ray Optics and Microanalysis - Chamonix, Mont Blanc, Frankreich
Dauer: 22 Sept. 200326 Sept. 2003

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