Abstract
The precise control of growth parameters in chemical beam epitaxy (CBE) is essential for high-quality photonic devices and monolithic integration in OEICs. We find a very narrow growth window suitable for high-quality GaInAsP. We observe a strong dependence of crystal quality from the V/III ratio at a growth temperature of 543°C. For GaInAsP with a band gap of 0.95 eV (λ = 1.3 μm) a miscibility gap occurs at this temperature. The material quality is demonstrated by very narrow photoluminescence linewidths of 3-5 meV at 4.2 K for (GaIn)(AsP) layers of varying compositions. Laser diodes grown under the optimised conditions without growth interruptions show very low threshold current densities of 62 A cm-2 per QW for 10 QWs. Internal losses can be reduced by using tensile-strained barriers.
Originalsprache | Englisch |
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Seiten (von - bis) | 505-510 |
Seitenumfang | 6 |
Fachzeitschrift | Journal of Crystal Growth |
Jahrgang | 183 |
Ausgabenummer | 4 |
DOIs | |
Publikationsstatus | Veröffentlicht - Feb. 1998 |