Characterization and optimization of electrooptic sampling by volume-integral-method and application of space-harmonic potential

M. Rottenkolber, W. Thomann, P. Russer

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

4 Zitate (Scopus)

Abstract

The relationship between the electric field-components of planar microwave structures and optical fields of a Gaussian sampling-beam of an Electrooptic-Sampling-System for the case of direct probing or the use of an electrooptic probe tip are essential for the application of noncontact and noninvasive measurement of high-frequency integrated microwave circuits. The described volume-integral-method yields a rigorous treatment of the influence of the electrical field and the optical beam. In case of an external electrooptic probe tip a layered structure with a space-harmonic potential is investigated in detail and results on sensitivity and spatial resolution are presented.

OriginalspracheEnglisch
TitelIEEE MTT-S International Microwave Symposium Digest
Herausgeber (Verlag)Publ by IEEE
Seiten265-268
Seitenumfang4
ISBN (Print)0780312090
PublikationsstatusVeröffentlicht - 1993
VeranstaltungProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3) - Atlanta, GA, USA
Dauer: 14 Juni 199318 Juni 1993

Publikationsreihe

NameIEEE MTT-S International Microwave Symposium Digest
Band1
ISSN (Print)0149-645X

Konferenz

KonferenzProceedings of the 1993 IEEE MTT-S International Microwave Symposium Digest, Part 1 (of 3)
OrtAtlanta, GA, USA
Zeitraum14/06/9318/06/93

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