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Change propagation analysis in complex technical systems

  • Monica Giffin
  • , Rene Keller
  • , Olivier De Weck
  • , Claudia Eckert
  • , Gergana Bounova
  • , John Clarkson
  • Massachusetts Institute of Technology (MIT)
  • Raytheon
  • Department of Engineering

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

19 Zitate (Scopus)

Abstract

Understanding how and why changes propagate during engineering design is critical because most products and systems emerge from predecessors and not through clean sheet design. This paper applies change propagation analysis methods and extends prior reasoning through examination of a large data set from industry including 41,500 change requests, spanning 8 years during the design of a complex sensor system. Different methods are used to analyze the data and the results are compared to each other and evaluated in the context of previous findings. In particular the networks of connected parent, child and sibling changes are resolved over time and mapped to 46 subsystem areas. A normalized change propagation index (CPI) is then developed, showing the relative strength of each area on the absorber-multiplier spectrum between -1 and +1. Multipliers send out more changes than they receive and are good candidates for more focused change management. Another interesting finding is the quantitative confirmation of the "ripple" change pattern. Unlike the earlier prediction, however, it was found that the peak of cyclical change activity occurred late in the program driven by systems integration and functional testing. Patterns emerged from the data and offer clear implications for technical change management approaches in system design.

OriginalspracheEnglisch
Titel2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007
Seiten183-192
Seitenumfang10
DOIs
PublikationsstatusVeröffentlicht - 2008
Extern publiziertJa
Veranstaltung19th Int. Conf. Design Theory and Methodology and 1st Int. Conf. Micro and Nano Systems, presented at - 2007 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2007 - Las Vegas, NV, USA/Vereinigte Staaten
Dauer: 4 Sept. 20077 Sept. 2007

Publikationsreihe

Name2007 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC2007
Band3 PART A

Konferenz

Konferenz19th Int. Conf. Design Theory and Methodology and 1st Int. Conf. Micro and Nano Systems, presented at - 2007 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, IDETC/CIE2007
Land/GebietUSA/Vereinigte Staaten
OrtLas Vegas, NV
Zeitraum4/09/077/09/07

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