TY - GEN
T1 - Block-Flushing
T2 - 22nd Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
AU - Lin, Yu Huei
AU - Ho, Tsung Yi
AU - Li, Bing
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2019 EDAA.
PY - 2019/5/14
Y1 - 2019/5/14
N2 - Programmable Microfluidic Devices (PMDs) have emerged as a new architecture for next-generation flow-based biochips. These devices can be dynamically reconfigured to execute different bioassays flexibly and efficiently owing to their two-dimensional regularly-arranged valve structure. During execution of a bioassay or between the execution of multiple bioassays, some areas on the PMD, however, become contaminated and must be cleaned by washing them with a buffer flow before they are reused. In this paper, we propose a novel block-based washing technique called block flushing. In this method, contaminated areas are first collected according to given patterns and flushed as a whole to increase washing efficiency. Simulation results show that with this technique the proposed method can achieve on average 28% improvement in reducing washing time compared with two other baseline solutions.
AB - Programmable Microfluidic Devices (PMDs) have emerged as a new architecture for next-generation flow-based biochips. These devices can be dynamically reconfigured to execute different bioassays flexibly and efficiently owing to their two-dimensional regularly-arranged valve structure. During execution of a bioassay or between the execution of multiple bioassays, some areas on the PMD, however, become contaminated and must be cleaned by washing them with a buffer flow before they are reused. In this paper, we propose a novel block-based washing technique called block flushing. In this method, contaminated areas are first collected according to given patterns and flushed as a whole to increase washing efficiency. Simulation results show that with this technique the proposed method can achieve on average 28% improvement in reducing washing time compared with two other baseline solutions.
UR - https://www.scopus.com/pages/publications/85066621438
U2 - 10.23919/DATE.2019.8715125
DO - 10.23919/DATE.2019.8715125
M3 - Conference contribution
AN - SCOPUS:85066621438
T3 - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
SP - 1531
EP - 1536
BT - Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 25 March 2019 through 29 March 2019
ER -