TY - GEN
T1 - Bits, Flips and RISCs
AU - Gerlin, Nicolas
AU - Kaja, Endri
AU - Vargas, Fabian
AU - Lu, Li
AU - Breitenreiter, Anselm
AU - Chen, Junchao
AU - Ulbricht, Markus
AU - Gomez, Maribel
AU - Tahiraga, Ares
AU - Prebeck, Sebastian
AU - Jentzsch, Eyck
AU - Krstic, Milos
AU - Ecker, Wolfgang
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Electronic systems can be submitted to hostile environments leading to bit-flips or stuck-at faults and, ultimately, a system malfunction or failure. In safety-critical applications, the risks of such events should be managed to prevent injuries or material damage. This paper provides a comprehensive overview of the challenges associated with designing and verifying safe and reliable systems, as well as the potential of the RISC-V architecture in addressing these challenges.We present several state-of-the-art safety and reliability verification techniques in the design phase. These include a highly-automated verification flow, an automated fault injection and analysis tool, and an AI-based fault verification flow. Furthermore, we discuss core hardening and fault mitigation strategies at the design level. We focus on automated SoC hardening using model-driven development and resilient processing based on sensing and prediction for space and avionic applications.By combining these techniques with the inherent flexibility of the RISC-V architecture, designers can develop tailored solutions that balance cost, performance, and fault tolerance to meet the requirements of various safety-critical applications in different safety domains, such as avionics, automotive, and space. The insights and methodologies presented in this paper contribute to the ongoing efforts to improve the dependability of computing systems in safety-critical environments.
AB - Electronic systems can be submitted to hostile environments leading to bit-flips or stuck-at faults and, ultimately, a system malfunction or failure. In safety-critical applications, the risks of such events should be managed to prevent injuries or material damage. This paper provides a comprehensive overview of the challenges associated with designing and verifying safe and reliable systems, as well as the potential of the RISC-V architecture in addressing these challenges.We present several state-of-the-art safety and reliability verification techniques in the design phase. These include a highly-automated verification flow, an automated fault injection and analysis tool, and an AI-based fault verification flow. Furthermore, we discuss core hardening and fault mitigation strategies at the design level. We focus on automated SoC hardening using model-driven development and resilient processing based on sensing and prediction for space and avionic applications.By combining these techniques with the inherent flexibility of the RISC-V architecture, designers can develop tailored solutions that balance cost, performance, and fault tolerance to meet the requirements of various safety-critical applications in different safety domains, such as avionics, automotive, and space. The insights and methodologies presented in this paper contribute to the ongoing efforts to improve the dependability of computing systems in safety-critical environments.
KW - GNN
KW - Hardening
KW - RISC-V
KW - Reliability
KW - Safety
KW - Verification
UR - http://www.scopus.com/inward/record.url?scp=85162219010&partnerID=8YFLogxK
U2 - 10.1109/DDECS57882.2023.10139331
DO - 10.1109/DDECS57882.2023.10139331
M3 - Conference contribution
AN - SCOPUS:85162219010
T3 - Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023
SP - 140
EP - 149
BT - Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023
A2 - Jenihhin, Maksim
A2 - Kubatova, Hana
A2 - Metens, Nele
A2 - Metens, Nele
A2 - Raik, Jaan
A2 - Ahmed, Foisal
A2 - Belohoubek, Jan
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023
Y2 - 3 May 2023 through 5 May 2023
ER -