TY - GEN
T1 - Automated construction of a cycle-approximate transaction level model of a memory controller
AU - Todorov, Vladimir
AU - Mueller-Gritschneder, Daniel
AU - Reinig, Helmut
AU - Schlichtmann, Ulf
PY - 2012
Y1 - 2012
N2 - Transaction level (TL) models are key to early design exploration, performance estimation and virtual prototyping. Their speed and accuracy enable early and rapid System-on-Chip (SoC) design evaluation and software development. Most devices have only register transfer level (RTL) models that are too complex for SoC simulation. Abstracting these models to TL ones, however, is a challenging task, especially when the RTL description is too obscure or not accessible. This work presents a methodology for automatically creating a TL model of an RTL memory controller component. The device is treated as a black box and a multitude of simulations is used to obtain results, showing its timing behavior. The results are classified into conditional probability distributions, which are reused within a TL model to approximate the RTL timing behavior. The presented method is very fast and highly accurate. The resulting TL model executes approximately 1200 times faster, with a maximum measured average timing offset error of 7.66%.
AB - Transaction level (TL) models are key to early design exploration, performance estimation and virtual prototyping. Their speed and accuracy enable early and rapid System-on-Chip (SoC) design evaluation and software development. Most devices have only register transfer level (RTL) models that are too complex for SoC simulation. Abstracting these models to TL ones, however, is a challenging task, especially when the RTL description is too obscure or not accessible. This work presents a methodology for automatically creating a TL model of an RTL memory controller component. The device is treated as a black box and a multitude of simulations is used to obtain results, showing its timing behavior. The results are classified into conditional probability distributions, which are reused within a TL model to approximate the RTL timing behavior. The presented method is very fast and highly accurate. The resulting TL model executes approximately 1200 times faster, with a maximum measured average timing offset error of 7.66%.
UR - http://www.scopus.com/inward/record.url?scp=84862095002&partnerID=8YFLogxK
U2 - 10.1109/date.2012.6176653
DO - 10.1109/date.2012.6176653
M3 - Conference contribution
AN - SCOPUS:84862095002
SN - 9783981080186
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 1066
EP - 1071
BT - Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th Design, Automation and Test in Europe Conference and Exhibition, DATE 2012
Y2 - 12 March 2012 through 16 March 2012
ER -