@inproceedings{2456d8e9be344374a19c45c47fe778fe,
title = "Analog fault simulation automation at schematic level with random sampling techniques",
abstract = "This paper presents an approach for analog fault effect simulation automation based on random fault selection with a high fault coverage of the circuit under test by means of fault injection and simulation based on advanced sampling techniques. The random fault selection utilizes the likelihood of the fault occurrence of different electrical components in the circuit with a confidence level. Defect models of different devices are analyzed for the calculation of the fault probability. A case study with our implemented tool demonstrates that likelihood calculation and fault simulation provides means for efficient fault effect simulation automation.",
keywords = "analog fault, defect model, fault coverage, fault injection, fault model, fault probability, fault simulation, sampling technique",
author = "Liang Wu and Hussain, {Mohammad Khizer} and Saed Abughannam and Wolfgang Muller and Christoph Scheytt and Wolfgang Ecker",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018 ; Conference date: 10-04-2018 Through 12-04-2018",
year = "2018",
month = may,
day = "29",
doi = "10.1109/DTIS.2018.8368549",
language = "English",
series = "Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--4",
booktitle = "Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018",
}