An analysis of industrial SRAM test results - A comprehensive study on effectiveness and classification of march test algorithms

Michael Linder, Alfred Eder, Ulf Schlichtmann, Klaus Oberländer

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

9 Zitate (Scopus)

Abstract

Editor's notes: This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient ones are identified.

OriginalspracheEnglisch
Aufsatznummer6587484
Seiten (von - bis)42-53
Seitenumfang12
FachzeitschriftIEEE Design and Test
Jahrgang31
Ausgabenummer3
DOIs
PublikationsstatusVeröffentlicht - Juni 2014

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