TY - GEN
T1 - A Scalable Design Flow for Performance Monitors Using Functional Path Ring Oscillators
AU - Kilian, Tobias
AU - Ahrens, Heiko
AU - Tille, Daniel
AU - Huch, Martin
AU - Schlichtmann, Ulf
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021
Y1 - 2021
N2 - The automotive industry sets high reliability standards for microcontroller (MCUs). To increase reliability, the automotive MCU manufacturers are looking for accurate performance screening. One of these performance screening mechanisms are functional path ring oscillators (RO). In this paper, a scalable and efficient method for creating functional path ring oscillators is presented. Implementation data demonstrate that functional path RO monitors show a significant advantage in area and power consumption over comparable performance screening methods.
AB - The automotive industry sets high reliability standards for microcontroller (MCUs). To increase reliability, the automotive MCU manufacturers are looking for accurate performance screening. One of these performance screening mechanisms are functional path ring oscillators (RO). In this paper, a scalable and efficient method for creating functional path ring oscillators is presented. Implementation data demonstrate that functional path RO monitors show a significant advantage in area and power consumption over comparable performance screening methods.
UR - http://www.scopus.com/inward/record.url?scp=85123059064&partnerID=8YFLogxK
U2 - 10.1109/ITC50571.2021.00041
DO - 10.1109/ITC50571.2021.00041
M3 - Conference contribution
AN - SCOPUS:85123059064
T3 - Proceedings - International Test Conference
SP - 299
EP - 303
BT - Proceedings - 2021 IEEE International Test Conference, ITC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 IEEE International Test Conference, ITC 2021
Y2 - 10 October 2021 through 15 October 2021
ER -