A microfabricated sensor for thin dielectric layers

P. Fierlinger, R. DeVoe, B. Flatt, G. Gratta, M. Green, S. Kolkowitz, F. Leport, M. Montero Diez, R. Neilson, K. O'Sullivan, A. Pocar, J. Wodin

Publikation: Beitrag in FachzeitschriftArtikelBegutachtung

4 Zitate (Scopus)

Abstract

We describe a sensor for the measurement of thin dielectric layers capable of operation in a variety of environments. The sensor is obtained by microfabricating a capacitor with interleaved aluminum fingers, exposed to the dielectric to be measured. In particular, the device can measure thin layers of solid frozen from a liquid or gaseous medium. Sensitivity to single atomic layers is achievable in many configurations and, by utilizing fast, high sensitivity capacitance readout in a feedback system onto environmental parameters; coatings of few layers can be dynamically maintained. We discuss the design, readout, and calibration of several versions of the device optimized in different ways. We specifically dwell on the case in which atomically thin solid xenon layers are grown and stabilized, in cryogenic conditions, from a liquid xenon bath.

OriginalspracheEnglisch
Aufsatznummer045101
FachzeitschriftReview of Scientific Instruments
Jahrgang79
Ausgabenummer4
DOIs
PublikationsstatusVeröffentlicht - 2008
Extern publiziertJa

Fingerprint

Untersuchen Sie die Forschungsthemen von „A microfabricated sensor for thin dielectric layers“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren