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A fault-model-based debugging aid for data warehouse applications

  • Indian Institute of Technology Madras
  • Ericsson Research

Publikation: Beitrag in Buch/Bericht/KonferenzbandKonferenzbeitragBegutachtung

Abstract

The paper describes a model-based approach to developing a general tool for localizing faults in applications of data warehouse technology. A model of the application is configured from a library of generic models of standard (types of) modules and exploited by a consistency-based diagnosis algorithm, originally used for diagnosing physical devices. Observing intermediate results can require high efforts or even be impossible, which limits the discriminability between different faults in a sequence of data processing steps. To compensate for this, fault models are used. This becomes a feasible solution for standard modules of a data warehouse application along with a stratification of the data. Fault models capture the potential impact of faults of process steps and data transfer on the data strata as well as on sets of data. Reflecting the nature of the initial symptoms and of the potential checks, these descriptions are stated at a qualitative level. The solution has been validated in customer report generation of a provider of mobile phone services.

OriginalspracheEnglisch
TitelECAI 2010
Herausgeber (Verlag)IOS Press
Seiten419-424
Seitenumfang6
ISBN (Print)9781607506058
DOIs
PublikationsstatusVeröffentlicht - 2010
Veranstaltung2nd Workshop on Knowledge Representation for Health Care, KR4HC 2010, held in conjunction with the 19th European Conference in Artificial Intelligence, ECAI 2010 - Lisbon, Portugal
Dauer: 17 Aug. 201017 Aug. 2010

Publikationsreihe

NameFrontiers in Artificial Intelligence and Applications
Band215
ISSN (Print)0922-6389
ISSN (elektronisch)1879-8314

Konferenz

Konferenz2nd Workshop on Knowledge Representation for Health Care, KR4HC 2010, held in conjunction with the 19th European Conference in Artificial Intelligence, ECAI 2010
Land/GebietPortugal
OrtLisbon
Zeitraum17/08/1017/08/10

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