90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

Stephan Henzler; Siegmar Koeppe; Winfried Kamp; Hans Mulatz; Doris Schmitt-Landsiedel

doi:10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

Stephan Henzler, Siegmar Koeppe, Winfried Kamp, Hans Mulatz, Doris Schmitt-Landsiedel

Medicine and Health

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

93 Zitate (Scopus)

Abstract

The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10ps_rms long-term clock jitter to ±1LSB.

Originalsprache	Englisch
Titel	2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC
Herausgeber (Verlag)	Institute of Electrical and Electronics Engineers Inc.
Seiten	548-550
Seitenumfang	3
ISBN (Print)	9781424420100
DOIs	https://doi.org/10.1109/ISSCC.2008.4523300
Publikationsstatus	Veröffentlicht - 2008
Veranstaltung	2008 IEEE International Solid State Circuits Conference, ISSCC - San Francisco, CA, USA/Vereinigte Staaten Dauer: 3 Feb. 2008 → 7 Feb. 2008

Publikationsreihe

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Band	51
ISSN (Print)	0193-6530

Konferenz

Konferenz	2008 IEEE International Solid State Circuits Conference, ISSCC
Land/Gebiet	USA/Vereinigte Staaten
Ort	San Francisco, CA
Zeitraum	3/02/08 → 7/02/08

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10.1109/ISSCC.2008.4523300

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Henzler, S., Koeppe, S., Kamp, W., Mulatz, H., & Schmitt-Landsiedel, D. (2008). 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. in 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC (S. 548-550). Artikel 4523300 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Band 51). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2008.4523300

Henzler, Stephan ; Koeppe, Siegmar ; Kamp, Winfried et al. / 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc., 2008. S. 548-550 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

@inproceedings{fd0b3ab60eef4dda9ee03b5b46e9d1c4,

title = "90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization",

abstract = "The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10psrms long-term clock jitter to ±1LSB.",

author = "Stephan Henzler and Siegmar Koeppe and Winfried Kamp and Hans Mulatz and Doris Schmitt-Landsiedel",

year = "2008",

doi = "10.1109/ISSCC.2008.4523300",

language = "English",

isbn = "9781424420100",

series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "548--550",

booktitle = "2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC",

note = "2008 IEEE International Solid State Circuits Conference, ISSCC ; Conference date: 03-02-2008 Through 07-02-2008",

}

Henzler, S, Koeppe, S, Kamp, W, Mulatz, H & Schmitt-Landsiedel, D 2008, 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. in 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC., 4523300, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, Bd. 51, Institute of Electrical and Electronics Engineers Inc., S. 548-550, 2008 IEEE International Solid State Circuits Conference, ISSCC, San Francisco, CA, USA/Vereinigte Staaten, 3/02/08. https://doi.org/10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. / Henzler, Stephan; Koeppe, Siegmar; Kamp, Winfried et al.
2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc., 2008. S. 548-550 4523300 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Band 51).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › Begutachtung

TY - GEN

T1 - 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

AU - Henzler, Stephan

AU - Koeppe, Siegmar

AU - Kamp, Winfried

AU - Mulatz, Hans

AU - Schmitt-Landsiedel, Doris

PY - 2008

Y1 - 2008

N2 - The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10psrms long-term clock jitter to ±1LSB.

AB - The concept and on-chip characterization circuitry of a 90nm local passive interpolation TDC is presented. With an interpolation factor of 4, the resolution is 4.7ps at 1.2V with 0.7 LSB single-shot precision at 19pJ/shot power consumption. The measured INL and DNL are ±1.2 and ±0.6 LSB, respectively. Active compensation limits the error caused by 10psrms long-term clock jitter to ±1LSB.

UR - http://www.scopus.com/inward/record.url?scp=46749143423&partnerID=8YFLogxK

U2 - 10.1109/ISSCC.2008.4523300

DO - 10.1109/ISSCC.2008.4523300

M3 - Conference contribution

AN - SCOPUS:46749143423

SN - 9781424420100

T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

SP - 548

EP - 550

BT - 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2008 IEEE International Solid State Circuits Conference, ISSCC

Y2 - 3 February 2008 through 7 February 2008

ER -

Henzler S, Koeppe S, Kamp W, Mulatz H, Schmitt-Landsiedel D. 90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. in 2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC. Institute of Electrical and Electronics Engineers Inc. 2008. S. 548-550. 4523300. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC.2008.4523300

90nm 4.7ps-Resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization

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