Abstract
X-ray waveguides [1-4] offer a novel approach for nanobeam production, which may become useful in coherent beam imaging and phase contrast projection microscopy [5]. Internal field enhancement, coherency properties, and coupling efficiency of these devices have been measured and compared to theoretic predictions. The fundamentals of x-ray wave guide optics can be derived from a scalar wave equation. Up to now, x-ray waveguide optics have exclusively been one-dimensional (ID), while many applications demand two-dimensionally (2D) confined point beams. We have recently demonstrated the first proof of principle that x-ray waveguide effects can be generalized to 2D devices using e-beam defined lithographic nanostructures [6], delivering of a coherent hard x-ray beam with nanometer sized cross-section (69 nm × 33 nm).
Originalsprache | Englisch |
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Seiten (von - bis) | 211-216 |
Seitenumfang | 6 |
Fachzeitschrift | Journal De Physique. IV : JP |
Jahrgang | 104 |
DOIs | |
Publikationsstatus | Veröffentlicht - März 2003 |
Extern publiziert | Ja |
Veranstaltung | 7th International Conference on X-Ray Microscopy - Grenoble, Frankreich Dauer: 28 Juli 2002 → 2 Aug. 2002 |