Publikationen pro Jahr
Publikationen pro Jahr
- 28 Ergebnisse
Suchergebnisse
-
2024
Electrochemical Impedance Spectroscopy for Ion Sensors with Interdigitated Electrodes: Capacitance Calculations, Equivalent Circuit Models and Design Optimizations
Korek, E. M., Teotia, R., Herbig, D. & Brederlow, R., Mai 2024, in: Biosensors. 14, 5, 241.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access -
Evaluation of vibration behavior at different sensing positions on gearboxes
Knoll, E., Rothemund, M., Otto, M., Rupprecht, B., Ochs, M., Vogel-Heuser, B., Brederlow, R. & Stahl, K., Dez. 2024, in: Forschung im Ingenieurwesen/Engineering Research. 88, 1, 29.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access -
Silicon-Based Piezoresistive Stress Sensor Arrays for Use in Flexible Tactile Skin
Verma, V., Torrent, A. N. I., Petrić, D., Haberhauer, V. & Brederlow, R., 2024, in: IEEE Transactions on Biomedical Circuits and Systems. 18, 4, S. 834-848 15 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access -
2023
Manufacturing of Flexible, Impedimetric Potassium Sensors
Korek, E. M., Kounoupioti, E. & Brederlow, R., 1 Mai 2023, in: IEEE Sensors Letters. 7, 5, 2000604.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
2 Zitate (Scopus) -
2022
Trends, Challenges, and Recent Advances in Electrochemical Impedance Spectroscopy
Mostafa, I. & Brederlow, R., 1 Mai 2022, in: IEEE Sensors Letters. 6, 5, 5500604.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
6 Zitate (Scopus) -
2021
A cost-effective, impediometric Na+-Sensor in fluids
Pfeffer, C., Zips, S., Muellner, E., Hefele, M., Kreupl, F., Wolf, B., Wolfrum, B., Liang, Y. & Brederlow, R., Juni 2021, in: IEEE Sensors Letters. 5, 6, 9387556.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
6 Zitate (Scopus) -
Towards easy-to-use bacteria sensing: Modeling and simulation of a new environmental impedimetric biosensor in fluids
Pfeffer, C., Liang, Y., Grothe, H., Wolf, B. & Brederlow, R., 2 Feb. 2021, in: Sensors (Switzerland). 21, 4, S. 1-13 13 S., 1487.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access1 Zitat (Scopus) -
2020
A CMOS Temperature Stabilized 2-D Mechanical Stress Sensor with 11-bit Resolution
Nurmetov, U., Fritz, T., Mullner, E., Dougherty, C. M., Szelong, M., Kreupl, F. & Brederlow, R., Apr. 2020, in: IEEE Journal of Solid-State Circuits. 55, 4, S. 846-855 10 S., 8984225.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
7 Zitate (Scopus) -
2018
A Hysteretic Buck Converter with 92.1% Maximum Efficiency Designed for Ultra-Low Power and Fast Wake-Up SoC Applications
Santoro, F., Kuhn, R., Gibson, N., Rasera, N., Tost, T., Graeb, H., Wicht, B. & Brederlow, R., Juni 2018, in: IEEE Journal of Solid-State Circuits. 53, 6, S. 1856-1868 13 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
34 Zitate (Scopus) -
2014
Architectural and circuit design techniques for power management of ultra-low-power MCU systems
Lueders, M., Eversmann, B., Gerber, J., Huber, K., Kuhn, R., Zwerg, M., Schmitt-Landsiedel, D. & Brederlow, R., 1 Nov. 2014, in: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22, 11, S. 2287-2296 10 S., 6680706.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
38 Zitate (Scopus) -
2012
An ultra low power bandgap operational at supply from 0.75 v
Ivanov, V., Brederlow, R. & Gerber, J., 2012, in: IEEE Journal of Solid-State Circuits. 47, 7, S. 1515-1523 9 S., 6191329.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
109 Zitate (Scopus) -
2011
Fully-integrated LDO voltage regulator for digital circuits
Lüders, M., Eversmann, B., Schmitt-Landsiedel, D. & Brederlow, R., 2011, in: Advances in Radio Science. 9, S. 263-267 5 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access8 Zitate (Scopus) -
2007
A complementary switched MOSFET architecture for the 1/f noise reduction in linear analog CMOS ICs
Koh, J., Schmitt-Landsiedel, D., Thewes, R. & Brederlow, R., Juni 2007, in: IEEE Journal of Solid-State Circuits. 42, 6, S. 1352-1361 10 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
19 Zitate (Scopus) -
Statistical model for the circuit bandwidth dependence of low-frequency noise in deep-submicrometer MOSFETs
Wirth, G. I., da Silva, R. & Brederlow, R., Feb. 2007, in: IEEE Transactions on Electron Devices. 54, 2, S. 340-345 6 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access24 Zitate (Scopus) -
2006
A physics-based low frequency noise model for MOSFETs under periodic large signal excitation
Brederlow, R., Koh, J. & Thewes, R., Apr. 2006, in: Solid-State Electronics. 50, 4, S. 668-673 6 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
12 Zitate (Scopus) -
Novel analytical and numerical approach to modeling low-frequency noise in semiconductor devices
Da Silva, R., Wirth, G. I. & Brederlow, R., 1 Apr. 2006, in: Physica A: Statistical Mechanics and its Applications. 362, 2, S. 277-288 12 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
19 Zitate (Scopus) -
2005
Effects of inhomogeneous negative bias temperature stress on p-channel MOSFETs of analog and RF circuits
Schlünder, C., Brederlow, R., Ankele, B., Gustin, W., Goser, K. & Thewes, R., Jan. 2005, in: Microelectronics Reliability. 45, 1, S. 39-46 8 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
33 Zitate (Scopus) -
Efficiency of body biasing in 90-nm CMOS for low-power digital circuits
Von Arnim, K., Borinski, E., Seegebrecht, P., Fiedler, H., Brederlow, R., Thewes, R., Berthold, J. & Pacha, C., Juli 2005, in: IEEE Journal of Solid-State Circuits. 40, 7, S. 1549-1555 7 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
41 Zitate (Scopus) -
Modeling of statistical low-frequency noise of deep-submicrometer MOSFETs
Wirth, G. I., Koh, J., da Silva, R., Thewes, R. & Brederlow, R., Juli 2005, in: IEEE Transactions on Electron Devices. 52, 7, S. 1576-1588 13 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
Open Access75 Zitate (Scopus) -
2004
RF and AMS
Bennett, H. S., Brederlow, R., Costa, J., Huang, M., Immorlica, A. A., Mueller, J. E., Racanelli, M., Weitzel, C. E. & Zhao, B., Nov. 2004, in: IEEE Circuits and Devices Magazine. 20, 6, S. 38-51 14 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
5 Zitate (Scopus) -
2003
A 128 × 128 CMOS Biosensor Array for Extracellular Recording of Neural Activity
Eversmann, B., Jenkner, M., Hofmann, F., Paulus, C., Brederlow, R., Holzapfl, B., Fromherz, P., Merz, M., Brenner, M., Schreiter, M., Gabl, R., Plehnert, K., Steinhauser, M., Eckstein, G., Schmitt-Landsiedel, D. & Thewes, R., Dez. 2003, in: IEEE Journal of Solid-State Circuits. 38, 12, S. 2306-2317 12 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
361 Zitate (Scopus) -
2002
Hot-carrier degradation of the low-frequency noise in MOS transistors under analog and RF operating conditions
Brederlow, R., Weber, W., Schmitt-Landsiedel, D. & Thewes, R., Sept. 2002, in: IEEE Transactions on Electron Devices. 49, 9, S. 1588-1596 9 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
26 Zitate (Scopus) -
2001
A mixed-signal design roadmap
Brederlow, R., Weber, W., Donnay, S., Wambacq, P., Sauerer, J. & Vertregt, M., Nov. 2001, in: IEEE Design and Test of Computers. 18, 6, S. 34-46 13 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
93 Zitate (Scopus) -
Low-frequency noise of integrated poly-silicon resistors
Brederlow, R., Weber, W., Dahl, C., Schmitt-Landsiedel, D. & Thewes, R., Juni 2001, in: IEEE Transactions on Electron Devices. 48, 6, S. 1180-1187 8 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
44 Zitate (Scopus) -
2000
Invited paper MOS transistor reliability under analog operation
Thewes, R., Brederlow, R., Schlünder, C., Wieczorek, P., Ankele, B., Hesener, A., Holz, J., Kessel, S. & Weber, W., 2000, in: Microelectronics Reliability. 40, 8-10, S. 1545-1554 10 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
28 Zitate (Scopus) -
Mismatch of MOSFET small signal parameters under analog operation
Thewes, R., Linnenbank, C., Kollmer, U., Burges, S., Schaper, U., Brederlow, R. & Weber, W., Dez. 2000, in: IEEE Electron Device Letters. 21, 12, S. 552-553 2 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
4 Zitate (Scopus) -
On the design robustness of threshold logic gates using multi-input floating gate MOS transistors
Luck, A., Jung, S., Brederlow, R., Thewes, R., Weber, W. & Goser, K., 2000, in: IEEE Transactions on Electron Devices. 47, 6, S. 1231-1240 10 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
21 Zitate (Scopus) -
1998
Precise quantitative evaluation of the hot-carrier induced drain series resistance degradation in LATID-n-MOSFETs
Walter, G. H., Weber, W., Brederlow, R., Jurk, R., Linnenbank, C. G., Schlünder, C., Schmitt-Landsiedel, D. & Thewes, R., 1998, in: Microelectronics Reliability. 38, 6-8, S. 1063-1068 6 S.Publikation: Beitrag in Fachzeitschrift › Artikel › Begutachtung
4 Zitate (Scopus)